Single Asperity Tribochemical Wear of Silicon Nitride Studied by Atomic Force Microscopy
Author(s): Maw W, Stevens F, Langford SC, Dickinson JT. J Appl Phys. 2002;92(9):5103–5109.
Nanometer scale single asperity tribochemical wear of silicon nitride was examined by measuring the wear of atomic force microscope tips translate… Read More »